Toquetti, Leandro Zeidan; Nogueira, Willian Aurélio; Santos Filho, Sebastião Gomes dos 
Source: SBMicro 2001: proceedings. Conference titles: International Conference on Microelectronics and Packaging. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
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TOQUETTI, Leandro Zeidan e NOGUEIRA, Willian Aurélio e SANTOS FILHO, Sebastião Gomes dos. A practical procedure to match the measured capacitance of low and high frequency in order to obtain the energy distribution of the interface stated density. 2001, Anais.. Brasília: SBMicro, 2001. . Acesso em: 13 maio 2024.APA
Toquetti, L. Z., Nogueira, W. A., & Santos Filho, S. G. dos. (2001). A practical procedure to match the measured capacitance of low and high frequency in order to obtain the energy distribution of the interface stated density. In SBMicro 2001: proceedings. Brasília: SBMicro.NLM
Toquetti LZ, Nogueira WA, Santos Filho SG dos. A practical procedure to match the measured capacitance of low and high frequency in order to obtain the energy distribution of the interface stated density. SBMicro 2001: proceedings. 2001 ;[citado 2024 maio 13 ]Vancouver
Toquetti LZ, Nogueira WA, Santos Filho SG dos. A practical procedure to match the measured capacitance of low and high frequency in order to obtain the energy distribution of the interface stated density. SBMicro 2001: proceedings. 2001 ;[citado 2024 maio 13 ]
